The Effect of Atomic Lattice Defects on the Softening Phenomena of High-Purity α-Iron

Some information on the size and density of voids that develop in several high purity metals and alloys during irradiation with neutrons at elevated temperatures has been reported as a function of irradiation parameters. An area of particular interest is the nucleation and early growth stage of voids. It is the purpose of this paper to describe the microstructure in high purity nickel after irradiation to a very low but constant neutron exposure at three different temperatures.Annealed specimens of 99-997% pure nickel in the form of foils 75μ thick were irradiated in a capsule to a total fluence of 2.2 × 1019 n/cm2 (E > 1.0 MeV). The capsule consisted of three temperature zones maintained by heaters and monitored by thermocouples at 350, 400, and 450°C, respectively. The temperature was automatically dropped to 60°C while the reactor was down.

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Contrast in Scanning Images of Thin Crystals

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100095856 ◽

1972 ◽

Vol 30 ◽

pp. 520-521

Author(s):

S. Kimoto ◽

H. Hashimoto ◽

S. Takashima ◽

R. M. Stern ◽

T. Ichinokawa

Keyword(s):

Crystal Surface ◽

Solid Angle ◽

Incident Angle ◽

Intensity Variation ◽

Lattice Defects ◽

Scanning Microscope ◽

Electron Detector ◽

Backscattered Electrons ◽

Electron Image ◽

Backscattered Electron

The most well known application of the scanning microscope to the crystals is known as Coates pattern. The contrast of this image depends on the variation of the incident angle of the beam to the crystal surface. The defect in the crystal surface causes to make contrast in normal scanning image with constant incident angle. The intensity variation of the backscattered electrons in the scanning microscopy was calculated for the defect in the crystals by Clarke and Howie. Clarke also observed the defect using a scanning microscope.This paper reports the observation of lattice defects appears in thin crystals through backscattered, secondary and transmitted electron image. As a backscattered electron detector, a p-n junction detector of 0.9 π solid angle has been prepared for JSM-50A. The gain of the detector itself is 1.2 x 104 at 50 kV and the gain of additional AC amplifier using band width 100 Hz ∼ 10 kHz is 106.

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Preparation and characterisation of vanadium pentoxide supported rhodium catalyst

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010010679x ◽

1988 ◽

Vol 46 ◽

pp. 946-947

Author(s):

A. Legrouri

Keyword(s):

Aqueous Solution ◽

Thermal Decomposition ◽

Physicochemical Properties ◽

Surface Area ◽

Vanadium Pentoxide ◽

High Purity ◽

Gas Adsorption ◽

Rhodium Catalyst ◽

Optical Methods ◽

Reducible Oxides

The industrial importance of metal catalysts supported on reducible oxides has stimulated considerable interest during the last few years. This presentation reports on the study of the physicochemical properties of metallic rhodium supported on vanadium pentoxide (Rh/V2O5). Electron optical methods, in conjunction with other techniques, were used to characterise the catalyst before its use in the hydrogenolysis of butane; a reaction for which Rh metal is known to be among the most active catalysts.V2O5 powder was prepared by thermal decomposition of high purity ammonium metavanadate in air at 400 °C for 2 hours. Previous studies of the microstructure of this compound, by HREM, SEM and gas adsorption, showed it to be non— porous with a very low surface area of 6m2/g3. The metal loading of the catalyst used was lwt%Rh on V2Q5. It was prepared by wet impregnating the support with an aqueous solution of RhCI3.3H2O.

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High-purity Ge x-ray detectors: Sensitivity factors and usefulness

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100136350 ◽

1990 ◽

Vol 48 (2) ◽

pp. 548-548

Author(s):

E. B. Steel

Keyword(s):

High Purity ◽

High Energy ◽

Quantitative Chemical Analysis ◽

Detector Performance ◽

X Ray ◽

Detector Sensitivity ◽

Specimen Holder ◽

Many Instruments ◽

Charge Resolution ◽

Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

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Crystal structure-size relationship in ultrafine metallic particles

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100153300 ◽

1989 ◽

Vol 47 ◽

pp. 266-267

Author(s):

Jun Liu ◽

Mehmet Sarikaya ◽

Ilhan A. Aksay

Keyword(s):

Ultrafine Particles ◽

Carbon Film ◽

Lattice Defects ◽

Careful Examination ◽

Seeded Growth ◽

Gold Particles ◽

Metallic Particles ◽

Interfacial Structures ◽

Typical Particle ◽

Many Particles

Ultrafine particles usually have unique physical properties. This study illustrates how the lattice defects and interfacial structures between particles are related to the size of ultrafine crystalline gold particles.Colloidal gold particles were produced by reducing gold chloride with sodium citrate at 100°C. In this process, particle size can be controlled by changing the concentration of the reactant. TEM samples are prepared by transferring a small amount of solution onto a thin (5 nm) carbon film which is suspended on a copper grid. In this work, all experiments were performed with Philips 430T at 300 kV.With controlled seeded growth, particles of different sizes are produced, as shown in Figure 1. By a careful examination, it can be resolved that very small particles have lattice defects with complex interfaces. Some typical particle structures include multiple twins, resulting in a five-fold symmetry bicrystals, and highly disordered regions. Many particles are too complex to be described by simple models.

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